ืžื™ืงื•ื ืžื“ื•ื™ืง ืฉืœ ืžื™ืงืจื•ืกืงื•ืค ื›ื™ืจื•ืจื’ื™

ื”ืœื™ื›ื™ื ื›ื™ืจื•ืจื’ื™ื™ื ื“ื•ืจืฉื™ื ื™ื›ื•ืœืช ืจืื™ื™ื” ืžื•ืฉืœืžืช ืฉืœ ืื–ื•ืจ ื”ื ื™ืชื•ื—. ื‘ืžืงืจื” ื–ื”, ื”ืžื ืชื— ื ืชืžืš ืคืขืžื™ื ืจื‘ื•ืช ื‘ืžื™ืงืจื•ืกืงื•ืค ื›ื™ืจื•ืจื’ื™. ื›ื“ื™ ืœืืคืฉืจ ืœืžื ืชื— ืœืžืงื ืืช ื”ืžื™ืงืจื•ืกืงื•ืค ื‘ืฆื•ืจื” ื”ื˜ื•ื‘ื” ื‘ื™ื•ืชืจ ื•ืœืชืช ืœืฆื•ื•ืช ื”ื›ื™ืจื•ืจื’ื™ ื™ื•ืชืจ ืžืงื•ื ืœื ื•ืข, ืขื“ืฉืช ื”ืžื™ืงืจื•ืกืงื•ืค ืžื•ืชืงื ืช ืขืœ ื–ืจื•ืข ืืจื•ื›ื” ืขืœ ื’ื‘ื™ ืžืขืžื“.

Fine positioning of the operating microscope
ื—ื™ื™ืฉื ื™ื ืงื™ื‘ื•ืœื™ื™ื